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Institute of Electrical
and Electronic Engineers
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IEEE
Central Texas Section
Power and Energy Society
San Antonio Chapter
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July Meeting Announcement
PDF Version
| Date: |
Thursday, July 29, 2010 |
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| Time: |
6:00 to 6:30 PM Social
6:30 to 7:00 PM Social/Dinner
7:00 to 8:00 PM Speaker Presentation |
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| Dinner: |
$10 for members.
$15 for non-members.
**Free for students**
The
price includes drink (iced tea or water), tip
and tax.
Barbeque meal includes brisket, beans and potato salad.
Cash only please, No
checks or credit cards. |
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| Location: |
Grady's
Bar-B-Q (No. 4)
6510 S. San Pedro Ave. (see below)
San Antonio, Texas 78216
210-805-8036 |
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| RSVP: |
Please RSVP to Christina Gaydos,
210-658-7550 or chris@grubbengineering.com |
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| Speaker: |
Stan Silvus, |
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| Bio: |
Stan Silvus, will be presenting a program on Failure Analysis of Electrical Components.
Stan Silvus started designing electronic circuits and analyzing electronic and electrical components when he was in the seventh grade.
During the summers that he was in college and for the first five years after he received his BSEE degree, he worked for Southwestern Industrial
Electronics in Houston, Texas, where he designed a variety of electronic instruments. Stan is a licensed professional engineer in the state of Texas,
a life member of the Institute of Electrical and Electronics Engineers (IEEE), and a charter member of the Electronic Device Failure Analysis Society (EDFAS).
For several years, he was a member of the Organizing Committee for the International Symposium for Testing and Failure Analysis (ISTFA). For many years,
he presented a tutorial on Failure Analysis of Passive Components at ISTFA.
He has also served as a consultant to the Joint Electron Devices Engineering Council (JEDEC) Committee 14.6, which addressed standardization issues in semiconductor-device
failure analysis. He has 42 publications, 21 of which deal with component-analysis topics, and 7 patents.
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| Presentation: |
Failure of Electrical Components |
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| Abstract: |
When an electrical component fails in a critical application (e.g., a nuclear power plant) or in a high-volume commercial product, a key questions arises: Was this an isolated event, or are all of the like components on the verge of failure?
A detailed failure analysis can usually provide an answer to this question so that appropriate corrective actions may be pursued. This presentation will briefly address preparations for a failure analysis as well as processes and tools used in failure analysis.
Additionally, several examples of failed electrical components and the findings of corresponding failure analyses will be discussed. |
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Directions:
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Grady's Bar-B-Q on
San Pedro: |
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From I-410, exit at San Pedro
Ave., turn south, and proceed to 6510 San Pedro.
Click here for a map from
Yahoo. |
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©
Copyright 2005 through 2010, Institute of Electrical and Electronics Engineers,
Inc |
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