Description
With the test technology facing its grand challenges to ensure the quality of ICs and electronic systems incorporating more and more sophisticated manufacturing processes and system integration technologies in various emerging applications such as Internet of Things, cloud computing, automotive electronics, etc., global proliferation and cooperation is increasingly more important. International Test Conference has been a flagship conference in test technology since 1970. With an attempt to stimulate more discussion and interaction between the academia and the industry around the globe, ITC-Asia was initiated in Taipei in 2017, and the 2 nd ITC-Asia will be held in Harbin China in 2018 and co-located with China Test Conference. Attendee can involve themselves in not only the state-of-the-art test technology trend, but also numerous industry / hot topic forums organized by China Test Conference.
Call for paper
Important Dates
Draft paper submission deadline：2018-02-19
Draft paper acceptance notification：2018-03-31
Abstract submission deadline：2018-02-05
Final paper submission deadline：2018-05-11
Topics of submission
Topics of Interests include (but are not limited to) the following topics:
Special Promotion: Security/Trust, Validation/Debug, Safety and Test for Automotive ICs
Hardware Oriented Security and Thrust
Design Validation and Debug
ATE Design
Analog and Mixed-Signal Test
RF Test
High-Speed I/O Test
Fault Modeling and Simulation
ATPG (Automatic Test Pattern
Generation)
Design for Testability
Built-In Self-Test
Delay Test
System-on-Chip Test
Test Compression
Power-Aware and/or Thermal-Aware Test
Memory Test, Diagnosis, and Repair
Fault Diagnosis and Failure Analysis
Yield Analysis and Learning
Safety and Test for Automotive ICs
Test for Internet of Things
Test for Emerging Devices
CPU/GPU Test
MEMS/Sensor Test
Online Test
On-Chip Measurement
SiP, 2.5D, and 3D IC Test
Interconnect Test
Board-Level Testing and Diagnosis
Test Standards
Test Economics
Reliability Issues
Fault Tolerance
Test for Reconfigurable Systems
Software Test and Reliability
Dependable Systems and Networks