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IEEE Boston Reliability Chapter
A Joint Chapter with New Hampshire and Providence


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Upcoming Events


5:30-7:30 PM, Wednesday, 10 October 2018 at 3 Forbes Road, Lexington, MA 02421

ESD System Level / Device Level Testing Pitfalls and Concerns

Tom Meuse - Thermo Fisher Scientific


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With all the different test standards and testing methods, system level and device level ESD testing can be confusing and lead to questionable results. Most system level tests rely on discharges from handheld simulators being brought into contact with different points on a complete "system". These discharges can be affected by numerous issues, from environmental to human inconstancies during the testing. Device level testing, although better controlled can also lead to questionable results, due to inconstancies in the test requirements and misunderstanding of the results. We'll review some of the pitfalls associated with the system level and device level testing methods and their impact on the product and protection designs. In addition, we'll review some of the new approaches to system level design, looking at new "co-operation" methods between system and device ESD protection designers.

This event is sponsored by the IEEE Boston Reliability Society and the Northeast Chapter of the ESD Association (NE-ESDA).

   


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