IEEE Boston Reliability Chapter
A Joint Chapter with New Hampshire and Providence

Contents

Meeting Presentations

July 2009	New England Lead-Free Electronics Consortium - Gregory Morose
July 2009	Evaluation of ROHS Compliant Nanotechnology Printed Circuit Board Finish for Pb-Free Assembly - Deb Fragoza, Bob Farrell, and Paul Bodmer
April 2009	The Mystery of the Non-Linear Increase in Cache SER - Shubu Mukherjee
March 2009	Microwave Device Reliability Characterization, The Mechanics of Life Test Execution and Analysis - Michael Benedek
January 2009	Practical Reliability Engineering for Semiconductor Equipment - Daniel J. Weidman


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