Exhibition
Current Support
Booth Availability
Exhibition Schedule
 Exhibitor Prospectus
<< Back
|
FRT is recognized as a valued partner for non-contact, optical metrology systems. FRT of America serves you by providing high quality automated measuring tools which fulfill your research, inspection and process verification needs. Delivering increased manufacturing yield, enhanced productivity, improved quality and product performance, because that's what it's about at the end of the day. The MicroProf measures step height, shape, thickness, roughness and more; our MicroProf TTV measures wafer thickness, TTV, bow and warp for full thickness, thinned and bonded wafers and our MicroSpy Topo DT is a high resolution 3D profilometer with confocal and interferometric measuring modes.
|
