| Feb 22 |
Designing for Reliability with ReliaSoft
Software |
Feb 21
|
JMP RELIABILITY PLATFORMS: A Zoom
In Then Zoom Out
Introduction |
| Jun 19 |
High-Power
Electron-Beam
Reliability: A Federal
Case - Daniel Weidman |
| Oct 18 |
ESD
System Level / Device
Level Testing Pitfalls
and Concerns - Tom
Meuse |
| May 18 |
From
Interconnect to
Innovation in the DoD
- Livia Racz |
| Jan 18 |
Automation
Analysis for Class 0
& CDM - Ted
Dangelmayer |
| Dec 21 |
QSG:
PROCESS AND VALUE
STREAM MAPPING BASICS |
| Dec 17 |
Trends
and Prospective in
Risk and Reliability
Engineering Research -
Mohammad
Pourgol-Mohammad |
| Sep 17 |
Creating
Reliable and
Manufacturable RF
Designs - Chandra
Gupta |
| May 17 |
Assessment
of Copper Bond Wire
for Use in Long Term
Military Applications
- Rispoli, Lecomte,
and DerMarderosian |
| Jan 17 |
Advances
and Breakthroughs in
Radars and
Phased-Arrays - Eli
Brookner |
| Dec 16 |
Microwave
and Millimeter Wave
Power Amplifiers:
Technology,
Applications,
Benchmarks, and Future
Trends - James Komiak |
| Nov 16 |
Intellectual
Property Key
Ingredients - Bill
Tonti |
| May 16 |
HALT
in the Product
Development Process -
Adam Bahret |
| Apr 16 |
Chernobyl
and Fukushima Lessons
for Nuclear Power
Plants Instrumentation
and Control Systems -
Mikhail Yastrebenetsky |
| Apr 16 |
Infrastructure
for Rapid Assessment
of Reliability -
Hannah Varner |
| Mar 16 |
ReliAbility
PhySics Based On
Causal Dynamic
NEtworks (RAPSODE) -
Simone Bortolami |
| Jan 16 |
Reliability
Growth Test Planning
and Data Analysis What
Are the Final Results
- Milena Krasich |
| Mar 15 |
System
Impact of Reliability
- Daniel Weidman |
| Feb 15 |
Recent
Progress in
Understanding the
Electrical Reliability
of GaN High-Electron
Mobility Transitors -
J. A. del Alamo |
| Jan 15 |
Class
0 & Reliability
ESD Case Studies - Ted
Dangelmayer |
| Jun 14 |
A
Guide to the New IEEE
730 Software Quality
Assurance Standard -
David Heimann |
| May 14 |
Personal
Power and the Art of
Perception - Leslie
Gabriel |
| Mar 14 |
Advanced
System Level ESD
Scanning - Jeff
Dunnihoo |
| Feb 14 |
Counterfeit
Analysis - Detection
& Quality Control
Non-Conformance
Issues, Prevention -
Hardware & Data
Destruction, Assured
Domestic Electronics
Recycling - Aaron
DerMarderosian, Morgan
Deptola |
| Jan 14 |
Those
Upsetting Ions -
Radiation Effects on
Electronics - Ethan
Cascio |
| Dec 13 |
Survivability
for Public Safety
Networks - Vanu Bose |
| Nov 13 |
Class
0 - Who's at Risk
& How to Avoid
Quality and
Reliability Failures -
Ted Dangelmayer |
| Sep 13 |
Reliability
of Li-Ion Batteries -
Martin Bazant |
| May 13 |
Certainty
of Operations: The
Origins of Reliability
Engineering in
Boston's Fire Alarm
and Transit Systems -
Gilmore Cooke |
| Mar 13 |
Electrical
Overstress - Many
Sources; Any
Solutions? - Terry
Welsher |
| Feb 13 |
Photonic
Magnetometry at a
(Short) Distance -
Chris Sataline |
| Mar 12 |
UV
Sources and Optics
Applications,
Infrastructure and
Component Reliability
- Vladimir Liberman |
| Nov 11 |
Failure
Modes and Effects
Analysis, A Risk and
Reliability Assessment
Tool - Angelo Scangas |
| Oct 11 |
Enhanced
Reliability through
Automated Design
Analysis for the
Electronics Indsutry -
Greg Kittlesen |
| Jun 11 |
Dramatic
COTS Pro-Active Design
Dfx Traced to
Innovative PDCA
Practice Collaboration
Efforts - Darryl
McKenney, Gene
Bridgers |
| Jun 10 |
IEEE
RS Standards: Status
and Descriptions, and
Collaboration Efforts
- Lou Gullo |
| May 10 |
How
Carbon Footprints,
Green Initiatives, and
Reliability Work
Together or Against
Each Other - Keith
Donaldson, Joe Spitz |
| Apr 10 |
Metrics
and Databases for
Agile Software
Development Projects -
David Heimann |
| Mar 10 |
Risk
Management: Proactive
Principles for Project
Success - Liz
Markewicz, Don
Restiano |
| Jan 10 |
Improvements in
Automated Reliability
Growth Plotting and
Estimations - Dave
Dwyer, Edward Wolfe,
Jonathan Cahill |
|
Moving Averages and
Trend Lines -
Additional Comments |
| Jul 09 |
New England Lead-Free
Electronics Consortium
- Gregory Morose |
| Evaluation
of ROHS Compliant
Nanotechnology Printed
Circuit Board Finish
for Pb-Free Assembly -
Deb Fragoza, Bob
Farrell, and Paul
Bodmer |
| Apr 09 |
The
Mystery of the
Non-Linear Increase in
Cache SER - Shubu
Mukherjee |
| Mar 09 |
Microwave
Device Reliability
Characterization, The
Mechanics of Life Test
Execution and Analysis
- Michael Benedek |
| Jan 09 |
Practical
Reliability
Engineering for
Semiconductor
Equipment - Daniel J.
Weidman |
