Date: 14 October 2002, Monday

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Conference Room 1 and 2
Complimentary Dinner 6:30PM, 7:00PM Program.

The Second Generation ZSP Digital Signal Processor

Speaker: Vijay Angarai, LSI Logic

Program Summary: This talk presents the second generation (G2) superscalar architecture that forms the basis for upcoming ZSP products. The second generation (G2) ZSP DSPs will mitigate design costs by employing this scalable architecture which can meet the performance requirements of high-end applications and the low power requirements of mobile applications. As compared to the current architecture implementation (ZSP400), which is a four-issue superscalar machine, the high end implementation of the architecture (ZSP600) is a six-issue superscalar machine. The architecture and design enhancements that boost the Instructions Per Cycle (IPC) count are presented.

Vijay Angarai completed his BE degree in Computer Eng. from Victoria Jubilee Technical Institute, India and his MS degree in Electrical Engineering from University of Texas at Dallas. He currently works with the Advanced DSP group in LSI Logic, Dallas. His research interests include signal processing architectures, computer arithmetic and low power design methodology.

For a copy of the trasparencies click here (560K)

For any further information please contact:

Vijay Angarai

LSI Logic
email:angarai@lsil.com
 

Date: 11 November 2002, Monday

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Conference Room 1 and 2
Complimentary Dinner 6:30PM, 7:00PM Program.

Multiple-gated resonant tunelling devices and circuits for multi-data systems

Speaker: Sam Villareal, The University of Texas at Dallas

Program Summary: Quantum-well devices, such as the Resonant Tunneling Diode (RTD), are natural candidates for multi-valued logic circuits and multi-data signal processing. This seminar presents mathematical models and equivalent circuits for several devices in the RTD family including the multiple-gated Resonant Tunneling Diode (mgRTD). A general mgRTD comparator is analyzed in detail using the mgRTD model presented because of this circuit¡Çs widespread application for many mixed-signal functions. For example, a novel 4B Analog-to-Digital circuit using predominately mgRTDs and mgRTD comparators has been recently developed and simulated using the simple device models presented. Similarly, a novel 4B Digital-to-Analog circuit, also based primarily on mgRTDs, has been developed and demonstrated to be compatible with its 4B ADC counterpart at moderate operating speeds (2 GHz to 4GHz).

Educational background:
B.S., Physics, Texas A&M University, May 1983
M.S., Electrical Engineering, Texas A&M University, December 1988
Ph.D., Electrical Engineering, Texas A&M University, December 1999
Professional experience:
Assistant Professor, Electrical Engineering, The University of Texas at Dallas, September 2000 to present.
Visiting Assistant Professor, Electrical Engineering, The University of Texas at Dallas, September 1999 to August 2000.
Assistant Professor, Engineering Technology, Texas A&M University, September 1992 to August 1999.
Technical Consultant, September 1992 to present.
Training Specialist, Texas Engineering Extension Service (TEEX), July 1985 to August 1992.
 

For a copy of the trasparencies click here (560K)

For any further information please contact:

Sam Villareal

The University of Texas at Dallas
email:svilla@utdallas.edu
 

Date: 10 December 2002, Tuesday

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Conference Room 1 and 2
Complimentary Dinner 6:30PM, 7:00PM Program.

Layout Strategies for Yield Enhancement and Area Minimization in Ratio-Critical Analog Circuits

Speaker: Prof. Randy Geiger, Iowa State University

Program Summary: Layout strategies for maximizing yield or minimizing area for ratio-critical analog circuits will be discussed. An analytical formulation of the relationship between yield and area as determined by random variations in resistance and capacitance densities and contact resistance will be presented. Layout strategies that improve or optimize yield will be discussed. A comparison of the yield attainable using popular layout techniques with more optimal layout strategies will be made. The presentation will be concluded with a discussion of layout strategies for minimizing total area in MOS switches that require extreme W/L ratios.

Randy Geiger received the Ph.D. Degree in Electrical Engineering from Colorado State University in 1977. From 1977 to 1990 he was a faculty member in the Electrical Engineering Department at Texas A&M University. He has been affiliated with the Department of Electrical and Computer Engineering at Iowa State University since 1990 and currently holds the title of Willard and Leitha Richardson Professor. Dr. Geiger?s teaching and research interests are in the area of analog and mixed-signal VLSI design with particular emphasis on data converters, amplifiers, high-speed communication circuits, BIST, and statistical modeling and design of mixed-signal systems for yield enhancement. Dr. Geiger is a past President of the IEEE Circuits and Systems Society and a past member of both the IEEE Publications Board and the IEEE Periodicals Council. He is a Fellow of IEEE and received the IEEE Millenium Medal in 2000.
For a copy of the trasparencies click here (560K)

For any further information please contact:

Randy Geiger

Iowa State University
email:rlgeiger@iastate.eduTBD
 

Date: 14 January 2003, Tuesday

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Conference Room 1 and 2
Complimentary Dinner 6:30PM, 7:00PM Program.

NBTI - A New Transistor Reliability Degradation Mechanism

Speaker: Dr. Vijay Reddy, Texas Instruments, Inc.

Program Summary: As deep sub-micron scaling accelerates, a new transistor reliability degradation mechanism called NBTI (or Negative Bias Temperature Instability) has recently emerged to be a potential showstopper for continued performance improvement. This presentation will discuss the current understanding of the NBTI mechanism along with its circuit reliability impact.

Vijay Reddy is a Member of the Group Technical Staff at Texas Instruments, Dallas, Texas. He received his Ph.D. in Electrical Engineering in 1994 from the University of Texas at Austin. He joined TI in 1994 and has worked on dielectric reliability, ESD, Latch-up, plasma charging, transistor reliability, and mobile ion testing of logic and DRAM technologies. Since 1998 he has focused on transistor and circuit reliability in sub-0.13um logic and embedded memory technologies. More recently his activities have included product reliability and qualification methodologies. He has published more than 20 papers and has several patents filed. He is serving as the Chair of the Device and Process Committee of the 2003 IRPS (International Reliability Physics Symposium) and has presented a tutorial on CMOS Reliability at IRPS.
For a copy of the trasparencies click here (200K)

For any further information please contact:

Vijay Reddy

Texas Instruments, Inc.
email:vreddy@ti.com
 

Date: 11 February 2003, Tuesday

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Conference Room 1 and 2
Complimentary Dinner 6:30PM, 7:00PM Program.

Current Trends in Analog Design for SOC

Speaker: Dr. John Fattaruso, Texas Instruments, Inc.

Program Summary: The design of analog circuit blocks for systems-on-a-chip is under constraints that are presently difficult, and in the future will be severe. Bandwiths and signal to noise ratios must be maintained in the face of decreasing power supply voltages, tighter supply current budgets, increasingly noisy substrate environments and shrinking devices with poor intrinsic analog processing capability. This presentation will summarize the current state of design techniques for maintaining acceptable analog performance within these constraints.

John W. Fattaruso grew up in Berkeley, CA, and received the B.S.(highest honors), M.S., and Ph.D. degrees in electrical engineering from the University of California, Berkeley, through 1986. He has been a Hertz Foundation Fellow, Teaching Associate, Research Assistant and Instructor at the University of California, Berkeley. In 1979 he worked in the Digital Signal Processing R&D group at Hewlett-Packard, Santa Clara, CA, and in 1985 he served as a consultant to Seeq Technology, San Jose, CA. Since 1987 he has been with various research and product development departments of Texas Instruments, Dallas, TX, working on analog VLSI technology. He was elected Distinguished Member of Technical Staff in 2001. His research interests include analog and RF circuit design, circuit simulation and optimization, neural networks and numerical analysis. He currently holds 23 patents in circuit design, has authored or co-authored 20 conference and journal papers, and has served on the analog program subcommittee of the ISSCC and as guest editor of the JSSC. Dr. Fattaruso is a member of Eta Kappa Nu, Tau Beta Pi and Phi Beta Kappa.

For a copy of the trasparencies click here (1M)

For any further information please contact:

John Fattaruso

Texas Instruments, Inc.
email:johnf@ti.com
 

Date: 17 March 2003, Tuesday

University of Texas at Dallas, Galaxy Room, Section A also known as SU2.604, that is, room 2.604 on the second floor of the Student Union building
Complimentary Dinner 6:30PM, 7:00PM Program.

Signal integriy in VDSM designs

Speaker: Jason Binney, Synopsys Inc

Program Summary: Much has been said on the fundamental challenges in deep sub micron (DSM) designs with respect to noise. In turn much confusion  has been created. As the  term "noise" is
very general applying to far ranging yet related design impacts  such as power structure noise, substrate noise, inductive noise, capacitive   noise etc, the talk's scope is narrowed to focus on the more
pressing challenges. From an engineering and scheduling point of view the current design impact during implementation from the noise source of coupled capacitive induced crosstalk on
the signal wires is one of the largest bottlenecks that designers are facing in closing many DSM designs. Generally referred to as a signal integrity problem with switching noise and static or glitch
noise being two manifestations of the coupled capacitive noise source also known as capacitive crosstalk. The intent of this presentation is to provide some insight from experience and case
studies of the methods used to handle capacitive crosstalk. These include synthesis  methods, routing and different analysis assumptions which are intended to help the designer make tradeoffs to streamline his/her design flow.

Jason Binney is a Sr Staff Corporate Application Engineer and has been working at Synopsys since 1995. His current primary  responsibilities have been with Physical Compiler and collaborating in technology partnership with some of Synopsys's key customers to provide requirements as the technology nodes move to deeper sub micron geometries.  Recently his related work  has focused on design closure with Signal Integrity in the Implementation flows from RTL2GDSII including pilot programs and tapeout projects with these capabilities.

For a copy of the trasparencies click here (1M)

For any further information please contact:

Jason Binney

email:jbinney@synopsys.com
 


 

Date: 22 April 2003, Tuesday

University of Texas at Dallas, Galaxy Room, Section A also known as SU2.604, that is, room 2.604 on the second floor of the Student Union building
Complimentary Dinner 6:30PM, 7:00PM Program.

Why Would We Choose Flip Chip?

Speaker: Scott Wood - ST Microelectronics


Program Summary:
Why choose flip chip?
I. Design Requirements that Drive to FlipChip
a. Large numbers of IO
b. Large numbers of Power/Gnd connections
c. High Performace Packaging
d. High Power Consumption
e. Nomimal Die Size
f. Multiple Power Supplies
II. Tradeoffs in FlipChip
a. Peripheral Bumps vs. Full Array
b. Peripheral IO vs. Core Array IO
III. CAD Problems to be Solved
a. IO Design
b. IO Placement
c. Single/Multiple Power Grids
d. Place and Route
e. Connectivity Checking
f. CoDesign of PCB, Substrate and Silico

Scott Wood
Graduated from University of Houston, TX, in 1984.
Texas Instruments 1978 - 1984  as:
        Equipment Engineering (Production Fab)
        Product/Test Engineering (Microcomputers)
ST Microelectronics 1984 - present as:
        Product/Test Engineering
        Retical Engineering for worldwide deployment
        Design Manager, Digital Backend Team
        Design Support Manager Central R&D, Region Americas

For a copy of the trasparencies click here

For any further information please contact:

Scott Wood


 

Date: 21 October 2003, Tuesday

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.

Ferroelectric Memories, ready for prime time or just another re-run?

Presenter: Hugh McAdams -- FRAM Memory Design Manager, TI

For a copy of the trasparencies click here (1M)

For any further information please contact:

Hugh McAdams


 


 

Date: 18 November 2003, Tuesday


Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Complimentary Dinner 6:30PM, 7:00PM Program.

Title: Sigma-Delta ADC for Telecom Applications

 Presenter: Franco Maloberti, The University of Texas at Dallas

Program Summary:
Sigma-delta converters have been conventionally used for low-bandwidth and high resolution. Recent results show that complex structures can achieve relatively high resolution while using a low oversampling ratio. Therefore, extending the signal bandwidth to the MHz bandwidth range enable using sigma-delta techniques to an increasing number of communication applications. This talk discusses band and resolution needs of modern communication schemes. Then, it reviews the sigma-delta techniques and finally it presents some recent results published in the literature and on-going studies on the topic carried on by students at the Analog Integrated Circuits and Sensors Laboratory, EE Department UT Dallas. It will be shown that, low-pass ADC with 2MHz band capable to satisfy the WCDMA specs consuming less than 4 mW and that 5 MHz band-pass ADC with 80 MHz IF and 80 dB SNR are achievable with modern CMOS  technologies.

Biography:
Franco Maloberti has actively served the IEEE and the CAS Society since 1995. Currently he is a member of the CAS Board of Governors. In the past he has served as CAS Vice President for Region 8. He has chaired 1 CAS conference, 2 CAS Workshops and guest edited 2 IEEE-TCAS II special issues. He is the President of the IEEE Sensor Council and he was the general Chair of the IEEE Sensors Conference in 2002.

Franco Maloberti is the Microelectronics Chair at the University of Dallas and Professor at the University of Pavia. Previously he was the inaugural holder of the TI J. Kilby Chair Professor of Engineering and professor of electrical engineering at the Texas A&M University. He has published more than 280 articles, three books and holds 16 Patents. He received the 1999 IEEE CAS Society Meritorious Service Award, the 2000 CAS Society Golden Jubilee Medal, and the IEEE Millenium Medal. Franco Maloberti received his university education from the Parma University, Italy(Laurea with Laudem). He received the Ph.D. Honoris Causa from INAOE, Puebla, Mexico. He is a Fellow of IEEE.

Date: 16 December 2003, Tuesday


Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Complimentary Dinner 6:30PM, 7:00PM Program.

Title: A New Class of Switch Architecture for High Performance Internet Switching and Routing

Presenter: Dr. Sanjeev Kumar, The University of Texas-Pan American

rogram Summary:
The shared-memory based packet switches are known to provide the best possible throughput performance for bursty data traffic in high-speed packet networks and Internet compared with other buffering schemes under conditions of identical memory resources deployed in the switch. However, scaling of shared-memory based switches to a larger size has been a challenge for researchers in the switching field, mainly due to the physical limitations imposed by the memory-access speed and the centralized control for switching functions in shared-memory switches. In this seminar, a new class of switching architecture called the sliding-window switch that is aimed at overcoming these bottlenecks will be presented. Comparative performance of the class of sliding-window switch will also be discussed.

Biography:
Dr. Sanjeev Kumar is involved in academic & industrial research & development, and teaching in the area of Network Security, Broadband Wireline and Wireless Data Networks, Digital Systems, Computer Architecture, and Hardware/Software design in the Department of Electrical Engineering at the University of Texas, Edinburg, TX. Before joining UTPA, Dr. Kumar worked with the leading networking companies in the US. In the networking industry, Dr. Kumar played an active role in strategic planning, engineering & development of new broadband switch devices, equipment and networks; Performance evaluation of broadband multiservice networks and protocols; Internetworking of wireline & wireless networks. Dr. Kumar's current research interests include all aspects of Network Security, Router Design, Internet architecture, Internet routing/switching protocols, Traffic engineering, Performance Evaluation, Optical switching, DWDM optical networks, Storage Area Networks, Wireless Ad Hoc and Sensor Networks.

Dr. Kumar has authored over 30 technical papers. Dr. Kumar's research findings have been cited by other researchers in the field. Dr. Kumar has served as a member of technical program committee for international conferences and reviewed research papers for leading networking conferences and journals. He has been awarded US patent for his inventions in the area of broadband networks. Dr. Kumar received the Ph.D. degree in Computer Engineering from North Carolina State University, Raleigh, North Carolina. He is a Senior member of IEEE.