Program at a Glance and Program Details
Final Program
KST | EEST Athens |
CEST (CET) Paris |
UTC | EDT New York |
PDT Los Angeles |
March. 7 (Tue.) |
TIME | #307 bc | #308 bc | #317 |
---|---|---|---|---|
Room B | Room D | Room F | ||
09:00~12:30 | Tutorial 1 "Technology for Advanced Semiconductor Manufacturing" |
Tutorial 2 "New Computing Paradigm: Quantum Computing" |
Tutorial 3 "Advanced Packaging Technology for Heterogeneous Integration" |
|
12:30~14:00 | Lunch (on your own) | |||
14:00~17:30 | Short Course 1 "Advances in Manufacturing and Processing Technologies" |
Short Course 2 "CMOS Image Sensor Technology" |
Short Course 3 "Power and Energy Devices" |
|
18:00~20:00 | Welcome Reception (3F, #327) |
March. 10 (Fri.) |
TIME | #301 | #307 bc | #307 a | #308 bc | #308 a | #317 | #318 |
3F, Lobby Exhibition 09:00~15:30 |
---|---|---|---|---|---|---|---|---|---|
Room A | Room B | Room C | Room D | Room E | Room F | Room G | |||
09:00~09:45 | [Plenary 5] "Innovation of Process Technology for Future Semiconductor" by Jong Myeong Lee (Samsung Electronics) (3F, Auditorium) |
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09:45~10:30 | [Plenary 6] "Meeting Scaling Challenges through Materials Engineering" by Mukund Srinivasan (Applied Materials) (3F, Auditorium) |
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10:30~10:40 | Coffee Break | ||||||||
10:40~12:15 | 49A | 50B | 51C | 52D | 53E | ||||
Power Devices and Widebandgap Heterostructures (4) | Application Reliability | Nanoscale Devices |
Group IV Devices | Wearable and Skin Compatible Sensor | |||||
12:15~13:15 | Lunch (on your own) | ||||||||
13:15~14:50 | 54A | 55B | 56C | 57D | 58E | ||||
Energy Materials and Devices | System Reliability | Nanoscale Fabrication | Devices for Emerging Applications | Wearable Display and Theoretical Study | |||||
14:50~15:00 | Break | ||||||||
15:00~15:30 | Closing & Awards Ceremony (3F, Auditorium) |
IEEE EDTM 2023 Topics | Session Code |
---|---|
1. Materials | 3C, 10C, 17C |
2. Process, Tools, Yield, and Manufacturing | 5E, 12E, 19E, 25E |
3. Semiconductor Devices | 31D, 38D, 45D, 52D, 57D |
4. Memory Technologies | 6F, 13F, 20F, 26F, 33F, 40F, 47F |
5. Photonics, Imaging and Display | 2B, 9B, 16B, 23B, 29B, 36B |
6. Power and Energy Devices | 28A, 35A, 42A, 49A, 54A |
7. Modeling and Simulation | 7G, 14G, 21G, 27G, 34G, 41G, 48G |
8. Reliability | 43B, 50B, 55B |
9. Packaging and Heterogeneous Integration | 1A ,8A, 15A, 22A |
10. Sensor, MEMS, Bio-Electronics | 4D, 11D, 18D |
11. Flexible and Wearable Electronics | 32E, 39E, 46E, 53E, 58E |
12. Nanotechnologies | 44C, 51C, 56C |
13. Disruptive Technologies - IoT, AI/ML, Neuromorphic & Quantum Computing | 24C, 30C, 37C |