1. Si Device |
Yuri Masuoka |
Samsung Electronics |
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2. Non-Si Device |
Prof Sung Hun Jin |
Incheon National University |
Prof Ki Jun Yu |
Yonsei University |
Prof. Donguk Nam |
Nanyang Technological University |
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3. Materials |
Suman Datta |
University of Notre Dame |
Navakanta Bhat |
Indian Institute of Science |
Yasumitsu Miyata |
Department of Physics, Tokyo Metropolitan University, Japan |
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4. Process |
Masaru Kurihara |
Hitachi |
Aaron Thean |
National University of Singapore |
Perrine Batude |
CEA-LETI |
Takeshi Nogami |
IBM |
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5. Modeling |
Shaloo Rakheja |
NYU |
Pierpaolo Palestri |
University of Udine |
Kenichiro Sonoda |
Renesas |
Saurabh Lodha |
IIT Bombay |
Shigeyasu Uno |
Ritsumeikan University |
|
6. Reliability |
Prof. Gaudenzio Meneghesso |
University of Padova |
Andrew Kim |
IBM |
Kin Leong Pey |
Singapore University of Technology and Design |
Jacopo Franco |
imec |
Maria Toledano |
GLOBALFOUNDRIES |
Albert Wang |
University of California Riverside |
Chee Lip Gan |
Nanyang Technological University |
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7. Packaging |
Yonghoon Kim |
Samsung Electro-Mechanical |
Prof. Tadahiro Kuroda |
Keio University |
Milind Shah |
Qualcomm |
Hideyuki Nasu |
Furukawa Electric Co., Ltd |
Hiroyuki Mori |
IBM |
Luke England |
GLOBALFOUNDRIES |
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8. Manufacturing |
Andrzej Strojwas |
Carnegie-Mellon University (CMU) |
Hardy Chen |
KLA-Tencor |
Julien Ryckaert |
IMEC |
Ya-Chieh Lai |
Cadence |
Patrick Lo Guo-Qiang |
IBM |
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